Metrology & Inspection system
FASTTEST: Specialised in-line inspection system
FASTTEST is a new metrology system for non-contact 3D inspection of micro-fluidic chips and other micro-featured components. FASTTEST offers a faster feedback on drifts in the manufacturing process to the manufacturer. In consequence, it allows faster intervention and therefore reducing waste by allowing alteration of the process before the products drift out of specifications. This benefits FASTTEST customers to save resources and be more efficient.
- Specialised in-line inspection system
- Smart combination of OCT and MV design: increased efficiency in terms of data acquisition to match manufacturing processing speeds in 3D
- Adapted solution to the particular manufacturing line: hardware and user-friendly software
- Secure data input and output protocols
- Fast and effective technical support
Quality inspection system for microfluidics and microdevices production
The end-users also benefit from FASTTEST, have higher quality assurance of the products they are purchasing. The main market for micro-devices currently targeted being disposable point-of-care medical devices, the long-term impact of FASTTEST is improved treatment and ultimately health for Europe and its citizens.
Easy integration in your production line
Its smart software allows FASTTEST to recognise features on the samples to be inspected using shape recognition algorithms and guide the laser beam only in the regions where depth information is critical to device functionality, hence minimising the data acquisition loads and increasing inspection rates. Its industry 4.0 interoperability allows for an easy connection to the rest of the manufacturing line.
A little bit more about characteristics:
Specialised in-line inspection instrument
FASTTEST offers a unique tailored solution to microdevice manufacturers. Its end-user driven development has ensured a perfect match between its specifications and the customer’s requirements. Its unique combination of technologies and optimised data acquisition methodology splitting the dimensionality of the measurement between OCT (depth) and MV (plane) allows the specific requirements of speed and accuracy of the micro-manufacturing industry to be addressed.
Smart combination of OCT and MV design for increased efficiency in terms of data acquisition to match manufacturing processing speeds in 3D
The automation of the acquisition of the depth information on user-selected features offers a 2 orders of magnitude (100 times) reduction in data load and hence increase in inspection time.
Adapted solution to the particular manufacturing line: hardware and user-friendly software
The FASTTEST instrument allows for easy customisation of the measurement resolution and range of the measurements to best fit a particular client’s inspection needs. Also, there are adaptable mechanical interfaces for easy insertion inside the manufacturing line. The reporting software is available in many forms: from simple pass/fail notification reports to drift monitoring of particular dimensions for manufacturing process feedback loops.
Secure data input and output protocols
STP formats as defined in ISO 10303 will be insertable into the FASTTEST GUI directly by the trained user without having to disclose the design to third parties. Secure protocols will be used for all data transfers.
Fast and effective technical support
ASE Optics offers a fast and efficient customer support to effectively minimise risks of down time for microdevice manufacturers.